Detec­tion Tech­nol­o­gy launch­es trend-set­ting flat pan­el detec­tors to ele­vate den­tal imag­ing

Detec­tion Tech­nol­o­gy, a glob­al leader in X‑ray detec­tor solu­tions, announces the launch of a first‑of‑its‑kind X‑Panel 2520z FOM flat pan­el detec­tor designed to ele­vate den­tal imag­ing. This trend‑setting 25 cm x 20 cm detec­tor is the first on the mar­ket to fea­ture advanced IGZO‑TFT tech­nol­o­gy at this size, deliv­er­ing a sig­nif­i­cant­ly larg­er field of view (FOV) and enhanced image qual­i­ty com­pared to tra­di­tion­al a‑Si pan­els.

The X‑Panel 2520z FOM sets a new bench­mark in den­tal imag­ing with its advanced fea­tures:

  • Enhanced field of view and res­o­lu­tion: An imag­ing area that is 95% larg­er with a res­o­lu­tion improve­ment of 30% when com­par­ing to tra­di­tion­al a‑Si pan­els, enabling the cap­ture of full-res­o­lu­tion CBCT (Cone Beam Com­put­ed Tomog­ra­phy) scans with excep­tion­al clar­i­ty.
  • Accel­er­at­ed imag­ing speed: With a frame rate of 25 fps (1x1) and 50 fps (2x2)—double that of con­ven­tion­al a‑Si panels—this detec­tor speeds up work­flow with­out com­pro­mis­ing image qual­i­ty.
  • Supe­ri­or low dose per­for­mance: The low-noise IGZO-TFT tech­nol­o­gy reduces elec­tron­ic noise by approx­i­mate­ly 50%, ensur­ing clear­er images even at reduced radi­a­tion dos­es.
  • Robust data han­dling: An inte­grat­ed image buffer allows the entire scan to be stored in inter­nal mem­o­ry, min­i­miz­ing the risk of data loss dur­ing crit­i­cal pro­ce­dures.
  • Com­pli­ance and sus­tain­abil­i­ty: A lead-free ver­sion of the detec­tor is avail­able, ensur­ing full com­pli­ance with RoHS direc­tives with­out exemp­tions.

The X‑Panel 2520z FOM is designed pri­mar­i­ly for den­tal CBCT imag­ing, offer­ing expan­sive imag­ing capa­bil­i­ties. In addi­tion to CBCT, it also pro­vides ver­sa­til­i­ty for panoram­ic imag­ing and has poten­tial for cephalo­met­ric appli­ca­tions, meet­ing the diverse needs of den­tal imag­ing.

The X‑Panel 2520z FOM is avail­able in two vari­ants, includ­ing a lead‑free ver­sion, ensur­ing full com­pli­ance with the RoHS direc­tive with­out exemp­tions. These tai­lored options pro­vide den­tal imag­ing OEMs (Orig­i­nal Equip­ment Man­u­fac­tur­ers) with the flex­i­bil­i­ty to select the con­fig­u­ra­tion that best meets their spe­cif­ic per­for­mance, cost, and reg­u­la­to­ry require­ments.

“Build­ing on the suc­cess of pre­vi­ous prod­ucts like the X‑Panel 1717z FDM, we are expand­ing our port­fo­lio fur­ther to meet the grow­ing mar­ket demand for com­plete and ver­sa­tile imag­ing solu­tions. The industry’s push for a larg­er FOV is met head-on with this new mod­el,” says Tuo­mas Hol­ma, Prod­uct Direc­tor at Detec­tion Tech­nol­o­gy. “Our com­mit­ment to local man­u­fac­tur­ing and com­pre­hen­sive service—across Fin­land and Chi­na, and a grow­ing pres­ence in India—ensures short­er response and deliv­ery times, and cost-effec­tive local prod­uct solu­tions, all while main­tain­ing high-qual­i­ty stan­dards. Our strong brand image, built on high per­for­mance, reli­a­bil­i­ty, and user-friend­li­ness, makes us the pre­ferred part­ner for den­tal imag­ing OEMs,” he added.

Eval­u­a­tion units will be avail­able in Q2 2025. Detec­tion Tech­nol­o­gy will show­case the X‑Panel 2520z FOM and its key fea­tures at the IDS exhi­bi­tion in Cologne, Ger­many, from March 25–29, 2025. Vis­it the team at stand T049 to expe­ri­ence the future of den­tal imag­ing first­hand.

Con­tact per­son
Tuo­mas Hol­ma, Prod­uct Direc­tor
tuomas.holma@deetee.com

About Detec­tion Tech­nol­o­gy

Detec­tion Tech­nol­o­gy is a glob­al provider of X‑ray detec­tor solu­tions and ser­vices for med­ical, secu­ri­ty, and indus­tri­al appli­ca­tions. The company’s solu­tions range from sen­sor com­po­nents to opti­mized detec­tor sub­sys­tems with ASICs, elec­tron­ics, mechan­ics, soft­ware, and algo­rithms. It has sites in Fin­land, Chi­na, France, India, and the US. The company’s shares are list­ed on Nas­daq First North Growth Mar­ket Fin­land under the tick­er sym­bol DETEC.

Source: Detec­tion Tech­nol­o­gy